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Instituto de Histología y Embriología "Dr. Mario H. Burgos"

Contenidos

Description

This advanced course aims to provide knowledge about super-resolution techniques: STED (Stimulated Emission Depletion Microscopy), STORM (Stochastic Optical Reconstruction Microscopy), SIM (Structured Illumination Microscopy), TIRF (Total Internal Reflection Microscopy), with special focus on CLEM (Correlative Light Electron Microscopy). We have emphasized on providing theoretical principles and practical experience on the CLEM technique thanks to its capability of combining fluorescence microscopy (FM) with the high resolution of electron microscopy (EM), on a selected region of a fixed or in vivo cell. This conceptually simple, but powerful dual approach indeed provides valuable relevant complementary information of biological processes. The course, which will include theoretical concepts and practical sessions with a final evaluation, is oriented towards biologically trained individuals, particularly graduate students and post-doctoral fellows. In addition to the advanced course, a workshop in the context of the Associate Membership of Argentina to the EMBLwill be held, which will include invited speakers of excellence in the filed. The advanced course and the workshop are supported by a grant from the Systema Nacional de Microscopía, Ministerio de Ciencia y Tecnología (MINCyT).


Venue


Instituto de Histología y Embriología Mendoza (IHEM-CONICET). Facultad de Ciencias Médicas. Universidad Nacional de Cuyo. Centro Universitario. Parque Gral. San Martín. Mendoza. Argentina.



Organizing Committee
  • General organizer:
Colombo, María Isabel

Technical responsible:

Ibáñez, Jorge
  • Co-organizers:

Aguilera, Milton Osmar

Delgui, Laura

Fader, Claudio

Technical support

Giménez, Cecilia (IHEM-CONICET. Argentina)

Mansilla, Maria Eugenia (IHEM-CONICET. Argentina)

Domizio, Norberto (IHEM-CONICET. Argentina)

Bocanegra, Elisa (IHEM-CONICET. Argentina)


Programa